產品(pin)時間:2022-12-12
冷熱(re)沖(chong)擊(ji)(ji)試(shi)(shi)(shi)驗(yan)(yan)箱是金屬、塑料、橡膠、電子(zi)等材(cai)料行(xing)業(ye)*的(de)測(ce)試(shi)(shi)(shi)設(she)備(bei),用于(yu)測(ce)試(shi)(shi)(shi)材(cai)料結構或復(fu)合材(cai)料,在(zai)瞬(shun)間(jian)下經*溫(wen)及極低溫(wen)的(de)連續環境下忍受的(de)程度,得以在(zai)短時間(jian)內檢測(ce)試(shi)(shi)(shi)樣因熱(re)脹冷縮所引起的(de)化學變(bian)化或物(wu)理傷(shang)害(hai)。冷熱(re)沖(chong)擊(ji)(ji)試(shi)(shi)(shi)驗(yan)(yan)箱滿足的(de)試(shi)(shi)(shi)驗(yan)(yan)方法:GB/T2423.1.2、GB/T10592-2008、GJB150.3高低溫(wen)沖(chong)擊(ji)(ji)試(shi)(shi)(shi)驗(yan)(yan)。高低溫(wen)沖(chong)擊(ji)(ji)試(shi)(shi)(shi)驗(yan)(yan)箱根據試(shi)(shi)(shi)驗(yan)(yan)需(xu)求及測(ce)試(shi)(shi)(shi)標(biao)準分為(wei)三箱式和(he)兩箱式,區別在(zai)于(yu)試(shi)(shi)(shi)驗(yan)(yan)方式和(he)內部(bu)
冷熱沖擊(ji)試驗箱簡介(jie):
冷熱(re)沖擊(ji)試(shi)(shi)(shi)(shi)驗(yan)箱是(shi)金屬、塑料(liao)、橡膠(jiao)、電子等材料(liao)行業*的(de)(de)(de)測試(shi)(shi)(shi)(shi)設備(bei),用(yong)于測試(shi)(shi)(shi)(shi)材料(liao)結構或(huo)復合材料(liao),在(zai)瞬間(jian)下經*溫及(ji)極(ji)低(di)溫的(de)(de)(de)連(lian)續環境下忍受的(de)(de)(de)程度,得以(yi)在(zai)最短時(shi)間(jian)內檢測試(shi)(shi)(shi)(shi)樣因熱(re)脹冷縮(suo)所(suo)引起(qi)的(de)(de)(de)化學變(bian)化或(huo)物(wu)理傷(shang)害。冷熱(re)沖擊(ji)試(shi)(shi)(shi)(shi)驗(yan)箱滿足的(de)(de)(de)試(shi)(shi)(shi)(shi)驗(yan)方法(fa):GB/T2423.1.2、GB/T10592-2008、GJB150.3高(gao)低(di)溫沖擊(ji)試(shi)(shi)(shi)(shi)驗(yan)。高(gao)低(di)溫沖擊(ji)試(shi)(shi)(shi)(shi)驗(yan)箱根據(ju)試(shi)(shi)(shi)(shi)驗(yan)需求(qiu)及(ji)測試(shi)(shi)(shi)(shi)標準分(fen)為三(san)箱式(shi)(shi)和(he)兩(liang)箱式(shi)(shi),區別在(zai)于試(shi)(shi)(shi)(shi)驗(yan)方式(shi)(shi)和(he)內部(bu)結構不同。三(san)箱式(shi)(shi)分(fen)為蓄(xu)冷室,蓄(xu)熱(re)室和(he)試(shi)(shi)(shi)(shi)驗(yan)室,產品在(zai)測試(shi)(shi)(shi)(shi)時(shi)是(shi)放置在(zai)試(shi)(shi)(shi)(shi)驗(yan)室。兩(liang)箱式(shi)(shi)分(fen)為高(gao)溫室和(he)低(di)溫室,是(shi)通過電機帶動(dong)(dong)提(ti)籃(lan)運動(dong)(dong)來實現高(gao)低(di)溫的(de)(de)(de)切換,產品放在(zai)提(ti)籃(lan)里(li),是(shi)隨提(ti)籃(lan)一(yi)起(qi)移動(dong)(dong)的(de)(de)(de)。
冷熱沖擊試驗箱特點:
1、控(kong)制器采用*10.2寸彩色中(zhong)英文LCD觸(chu)摸屏,中英文頁面切換,操作簡單;
2、沖擊方(fang)式(shi)為風路(lu)切換方(fang)式(shi)將溫度導(dao)入測試(shi)區,做冷熱沖擊測試(shi);
3、設備區(qu)(qu)(qu)分(fen)為高溫區(qu)(qu)(qu)、低(di)溫區(qu)(qu)(qu)、測試區(qu)(qu)(qu)三(san)部(bu)分(fen),各區(qu)(qu)(qu)之間(jian)采用*的斷熱結構;
5、冷卻(que)采用(yong)二元(yuan)冷凍(dong)系統,降溫效(xiao)果快速,冷卻(que)方(fang)式(shi)(shi)為風冷式(shi)(shi)或水(shui)冷式(shi)(shi)兩種,常用(yong)風冷方(fang)式(shi)(shi);
6、支持USB導出,方便數據存儲;